We investigated the colors of graphene and graphene-oxide multilayers that were deposited on various dielectric layers. In particular, the effects of the material thickness, the types of dielectric layers, and the existence of a back silicon substrate were analyzed. The colors of graphene-oxide layers on a SiO2/Si substrate were found to periodically change as the material thickness increased. However, the colors of graphene layers on the same substrate became saturated without a similar periodic change. The calculated colors corresponding to the material thicknesses were verified by optical microscopy and profilometry. We believe that these results demonstrate the possibility of utilizing color as a simple tool for detecting and estimating the thicknesses of graphene and graphene-oxide multilayers.