Widefield heterodyne interferometry using a custom CMOS modulated light camera

Opt Express. 2011 Nov 21;19(24):24546-56. doi: 10.1364/OE.19.024546.

Abstract

In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of ±6.6°. The added value of this method to acquire widefield images are discussed along with the advantages.

MeSH terms

  • Equipment Design
  • Equipment Failure Analysis
  • Interferometry / instrumentation*
  • Photography / instrumentation*
  • Semiconductors*
  • Signal Processing, Computer-Assisted / instrumentation*