Robust modeling based on optimized EEG bands for functional brain state inference

J Neurosci Methods. 2012 Jan 30;203(2):377-85. doi: 10.1016/j.jneumeth.2011.10.015. Epub 2011 Oct 21.

Abstract

The need to infer brain states in a data driven approach is crucial for BCI applications as well as for neuroscience research. In this work we present a novel classification framework based on Regularized Linear Regression classifier constructed from time-frequency decomposition of an EEG (electro-encephalography) signal. The regression is then used to derive a model of frequency distributions that identifies brain states. The process of classifier construction, preprocessing and selection of optimal regularization parameter by means of cross-validation is presented and discussed. The framework and the feature selection technique are demonstrated on EEG data recorded from 10 healthy subjects while requested to open and close their eyes every 30 s. This paradigm is well known in inducing Alpha power modulations that differ from low power (during eyes opened) to high (during eyes closed). The classifier was trained to infer eyes opened or eyes closed states and achieved higher than 90% classification accuracy. Furthermore, our findings reveal interesting patterns of relations between experimental conditions, EEG frequencies, regularization parameters and classifier choice. This viable tool enables identification of the most contributing frequency bands to any given brain state and their optimal combination in inferring this state. These features allow for much greater detail than the standard Fourier Transform power analysis, making it an essential method for both BCI proposes and neuroimaging research.

Publication types

  • Research Support, Non-U.S. Gov't
  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Algorithms
  • Brain Mapping / methods*
  • Electroencephalography / instrumentation
  • Electroencephalography / methods*
  • Evoked Potentials / physiology*
  • Humans
  • Models, Neurological*
  • Signal Processing, Computer-Assisted*
  • Software / standards*