Data compressive paradigm for multispectral sensing using tunable DWELL mid-infrared detectors

Opt Express. 2011 Sep 26;19(20):19454-72. doi: 10.1364/OE.19.019454.

Abstract

While quantum dots-in-a-well (DWELL) infrared photodetectors have the feature that their spectral responses can be shifted continuously by varying the applied bias, the width of the spectral response at any applied bias is not sufficiently narrow for use in multispectral sensing without the aid of spectral filters. To achieve higher spectral resolutions without using physical spectral filters, algorithms have been developed for post-processing the DWELL's bias-dependent photocurrents resulting from probing an object of interest repeatedly over a wide range of applied biases. At the heart of these algorithms is the ability to approximate an arbitrary spectral filter, which we desire the DWELL-algorithm combination to mimic, by forming a weighted superposition of the DWELL's non-orthogonal spectral responses over a range of applied biases. However, these algorithms assume availability of abundant DWELL data over a large number of applied biases (>30), leading to large overall acquisition times in proportion with the number of biases. This paper reports a new multispectral sensing algorithm to substantially compress the number of necessary bias values subject to a prescribed performance level across multiple sensing applications. The algorithm identifies a minimal set of biases to be used in sensing only the relevant spectral information for remote-sensing applications of interest. Experimental results on target spectrometry and classification demonstrate a reduction in the number of required biases by a factor of 7 (e.g., from 30 to 4). The tradeoff between performance and bias compression is thoroughly investigated.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Algorithms*
  • Data Compression*
  • Image Interpretation, Computer-Assisted / methods
  • Spectroscopy, Fourier Transform Infrared / methods*
  • Stochastic Processes
  • Thermography / methods*