Energy-band engineering for improved charge retention in fully self-aligned double floating-gate single-electron memories

Nano Lett. 2011 Nov 9;11(11):4520-6. doi: 10.1021/nl202434k. Epub 2011 Oct 17.

Abstract

We present a new fully self-aligned single-electron memory with a single pair of nano floating gates, made of different materials (Si and Ge). The energy barrier that prevents stored charge leakage is induced not only by quantum effects but also by the conduction-band offset that arises between Ge and Si. The dimensions and position of each floating gate are well-defined and controlled. The devices exhibit a long retention time and single-electron injection at room temperature.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Energy Transfer
  • Equipment Design
  • Equipment Failure Analysis
  • Information Storage and Retrieval*
  • Nanotechnology / instrumentation*
  • Semiconductors*
  • Signal Processing, Computer-Assisted / instrumentation*
  • Static Electricity