A technique for improving the sensitivity of high mass molecular analysis is described. Three carbon species, fullerenes, single walled carbon nanotubes, and highly ordered pyrolytic graphite are introduced as matrices for the secondary ion mass spectrometry analysis of cyclodextrin (C(42)H(70)O(35), 1134 u). The fullerene and nanotubes are deposited as single deposition, and 10, 20, or 30 deposition films and cyclodextrin is deposited on top. The cyclodextrin parent-like ions and two fragments were analyzed. A 30 deposition fullerene film enhanced the intensity of cationized cyclodextrin with Na by a factor of 37. While the C(6)H(11)O(5) fragment, corresponding to one glucopyranose unit, increased by a factor of 16. Although fragmentation on fullerene is not suppressed, the intensity is twice as low as the parent-like ion. Deprotonated cyclodextrin increases by 100× and its C(8)H(7)O fragment by 10×. While the fullerene matrix enhances secondary ion emission, the nanotubes matrix film generates a basically constant yield. Graphite gives rise to lower intensity peaks than either fullerene or nanotubes. Scanning electron microscopy and atomic force microscopy provide images of the fullerene and nanotubes deposition films revealing flat and web structured surfaces, respectively. A "colliding ball" model is presented to provide a plausible physical mechanism of parent-like ion enhancement using the fullerene matrix.
© American Society for Mass Spectrometry, 2011