The role of Poisson's binomial distribution in the analysis of TEM images

Ultramicroscopy. 2011 Nov;111(11):1553-6. doi: 10.1016/j.ultramic.2011.08.010. Epub 2011 Sep 8.

Abstract

Frank's observation that a TEM bright-field image acquired under non-stationary conditions can be modeled by the time integral of the standard TEM image model [J. Frank, Nachweis von objektbewegungen im lichtoptis- chen diffraktogramm von elektronenmikroskopischen auf- nahmen, Optik 30 (2) (1969) 171-180.] is re-derived here using counting statistics based on Poisson's binomial distribution. The approach yields a statistical image model that is suitable for image analysis and simulation.