Surface x-ray diffraction analysis using a genetic algorithm: the case of Sn/Cu(100)-[Formula: see text]

J Phys Condens Matter. 2009 Apr 1;21(13):134011. doi: 10.1088/0953-8984/21/13/134011. Epub 2009 Mar 12.

Abstract

The application of genetic algorithms to the analysis of surface x-ray diffraction data is discussed and the implementation of a genetic algorithm of evolutionary type is described in detail. The structure of Sn/Cu(100)-[Formula: see text] is determined on the basis of surface x-ray diffraction data analysed using this algorithm. The results are compared to previous findings using other techniques.