On the implementation of computed laminography using synchrotron radiation

L Helfen; A Myagotin; P Mikulík; P Pernot; A Voropaev; M Elyyan; M Di Michiel; J Baruchel; T Baumbach

doi:10.1063/1.3596566

On the implementation of computed laminography using synchrotron radiation

Rev Sci Instrum. 2011 Jun;82(6):063702. doi: 10.1063/1.3596566.

Authors

L Helfen¹, A Myagotin, P Mikulík, P Pernot, A Voropaev, M Elyyan, M Di Michiel, J Baruchel, T Baumbach

Affiliation

¹ Institut für Synchrotronstrahlung (ISS/ANKA), Karlsruhe Institute of Technology (KIT), D-76128 Karlsruhe, Germany. lukas.helfen@kit.edu

PMID: 21721697
DOI: 10.1063/1.3596566

Abstract

Hard x rays from a synchrotron source are used in this implementation of computed laminography for three-dimensional (3D) imaging of flat, laterally extended objects. Due to outstanding properties of synchrotron light, high spatial resolution down to the micrometer scale can be attained, even for specimens having lateral dimensions of several decimeters. Operating either with a monochromatic or with a white synchrotron beam, the method can be optimized to attain high sensitivity or considerable inspection throughput in synchrotron user and small-batch industrial experiments. The article describes the details of experimental setups, alignment procedures, and the underlying reconstruction principles. Imaging of interconnections in flip-chip and wire-bonded devices illustrates the peculiarities of the method compared to its alternatives and demonstrates the wide application potential for the 3D inspection and quality assessment in microsystem technology.