Advanced materials nanocharacterization

Nanoscale Res Lett. 2011 Jan 31;6(1):107. doi: 10.1186/1556-276X-6-107.

Abstract

This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13th to 17th September, 2010.