An automated particle analysis routine is implemented on an electron microprobe for analyzing the chemical composition and projective area of populations of individual silver halide microcrystals. An LN2 cryostage is used to prevent material degradation due to reaction with the impinging electron beam. The background in the EDX spectra is lowered by depositing the microcrystals on a carbon-coated copper grid, mounted in a transmission holder. The ILα/AgLα net X-ray intensity ratio, obtained from a spectrum-fitting algorithm, is used to determine the crystal composition by means of a standard-based calibration curve. The uncertainty on the concentration measurement of individual microcrystals is calculated using the uncertainties on the net X-ray counts and the uncertainties on the calibration curve. The area measurement is optimized by introducing a gray value histogram correction on each individual measurement. Overlapping microcrystals are scrapped from the analysis by defining a maximum shape factor, against which the shape factor of the microcrystal is tested. To minimize problems with drift of the cryostage, spectrum acquisition is carried out immediately after a single microcrystal has been located, based on the backscattered electron image. Several applications are discussed.