The Young modulus of individual single-walled boron nitride nanotubes (SW-BNNTs) was determined using a high-resolution transmission-electron microscope (HRTEM)-atomic force microscope (AFM) set-up. The Young modulus and maximum stress for these NTs were deduced from the analysis of the stress-strain curves, and discussed as a function of the considered value for the shell thickness of an SW-BNNT. The elastic properties of bundles of SW-BNNTs were also investigated. All these experiments revealed that SW-BNNTs are very flexible. Furthermore, the electrical behavior of these SW-BNNTs was also analyzed employing a scanning tunneling microscope (STM) holder integrated with the same HRTEM. I/V curves were measured on individual tubes as well as on bundles of SW-BNNTs.