Note: ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

D Chavan; D Andres; D Iannuzzi

doi:10.1063/1.3579496

Note: ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature

Rev Sci Instrum. 2011 Apr;82(4):046107. doi: 10.1063/1.3579496.

Authors

D Chavan¹, D Andres, D Iannuzzi

Affiliation

¹ Faculty of Sciences, Department of Physics and Astronomy and LaserLaB, Vrije Universiteit, Amsterdam, The Netherlands.

PMID: 21529051
DOI: 10.1063/1.3579496

Abstract

In a recent paper [D.Chavan et al., Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K).