The surface topography of the choroid plexus. Environmental, low and high vacuum scanning electron microscopy

Ann Anat. 2011 May;193(3):197-204. doi: 10.1016/j.aanat.2011.02.016. Epub 2011 Mar 16.

Abstract

Environmental scanning electron microscopy (ESEM) allows the examination of hydrated and dried specimens without a conductive metal coating which could be advantageous in the imaging of biological and medical objects. The aim of this study was to assess the performance and benefits of wet-mode and low vacuum ESEM in comparison to high vacuum scanning electron microscopy (SEM) using the choroid plexus of chicken embryos as a model, an organ of the brain involved in the formation of cerebrospinal fluid in vertebrates. Specimens were fixed with or without heavy metals and examined directly or after critical point drying with or without metal coating. For wet mode ESEM freshly excised specimens without any pre-treatment were also examined. Conventional high vacuum SEM revealed the characteristic morphology of the choroid plexus cells at a high resolution and served as reference. With low vacuum ESEM of dried but uncoated samples the structure appeared well preserved but charging was a problem. It could be reduced by a short beam dwell time and averaging of images or by using the backscattered electron detector instead of the gaseous secondary electron detector. However, resolution was lower than with conventional SEM. Wet mode imaging was only possible with tissue that had been stabilized by fixation. Not all surface details (e.g. microvilli) could be visualized and other structures, like the cilia, were deformed. In summary, ESEM is an additional option for the imaging of bio-medical samples but it is problematic with regard to resolution and sample stability during imaging.

Publication types

  • Comparative Study

MeSH terms

  • Animals
  • Chick Embryo
  • Choroid Plexus / ultrastructure*
  • Microscopy, Electron, Scanning / instrumentation*
  • Microscopy, Electron, Scanning / methods*
  • Reproducibility of Results
  • Sensitivity and Specificity
  • Surface Properties
  • Vacuum