Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffraction

Yuan Ji; Li Wang; Yinqi Zhang; Bin Wei; Jianhong Wang; Yanling Cheng; Hongli Suo

doi:10.1016/j.ultramic.2011.01.006

Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffraction

Ultramicroscopy. 2011 Apr;111(5):314-9. doi: 10.1016/j.ultramic.2011.01.006. Epub 2011 Jan 19.

Authors

Yuan Ji¹, Li Wang, Yinqi Zhang, Bin Wei, Jianhong Wang, Yanling Cheng, Hongli Suo

Affiliation

¹ Beijing University of Technology, Institute of Microstructure and Property of Advanced Materials, Beijing 100124, China. jiyuan@bjut.edu.cn

PMID: 21396525
DOI: 10.1016/j.ultramic.2011.01.006

Abstract

Electron backscatter diffraction (EBSD) was used for distinguishing crystallographic orientations and local lattice misfits of a La(2)Zr(2)O(7) (LZO) buffer layer epitaxially grown on a cube textured Ni-5.%W (Ni-W) substrate for a YBCO superconductor film. Orientation data were obtained from the LZO epilayer using low energy primary electrons (5keV) and from the Ni-W substrate by increasing the voltage to 15keV. In-plane and out-of-plane orientations of the LZO epilayer were revealed with respect to its Ni-W substrate. A strong {100} 〈011〉 rotated-cube texture in the LZO epilayer was formed on the {100} 〈001〉 cube-textured Ni-W substrates. LZO and Ni in-plane crystallographic axes are related by an expected 45° rotation. The step-misorientations and the local misfit strains between the LZO epilayer and the substrate were also analyzed.