Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Kurt A Langworthy; David H Krinsley; Ronald I Dorn

doi:10.1002/sca.20226

Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Scanning. 2011 Mar-Apr;33(2):78-81. doi: 10.1002/sca.20226. Epub 2011 Mar 4.

Authors

Kurt A Langworthy¹, David H Krinsley, Ronald I Dorn

Affiliation

¹ CAMCOR, University of Oregon, Eugene, Oregon 97403-1241, USA. klangwor@uoregon.edu

PMID: 21381046
DOI: 10.1002/sca.20226

Abstract

Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.