Absolute measurement of surface and bulk absorption in DUV optics from temperature induced wavefront deformation

Opt Express. 2010 Oct 11;18(21):21534-9. doi: 10.1364/OE.18.021534.

Abstract

A measurement system for quantitative determination of both surface and bulk contributions to the photo-thermal absorption in DUV optics was developed. It is based upon a Hartmann-Shack wavefront sensor with a sensitivity of ~λ/10000 rms, accomplishing precise on-line monitoring of wavefront deformations of a collimated test laser beam transmitted perpendicular through the excimer laser-irradiated site of a cuboid sample. Caused by the temperature dependence of the refractive index as well as thermal expansion, the initially plane wavefront of the test laser is distorted into a cylindrical shape, with bending ends towards the surface. Sign and magnitude depend on index change and expansion. By comparison with thermal theory, this transient wavefront distortion yields a quantitative absolute measure of bulk and surface absorption losses in the sample. First rresults for fused silica are presented.

MeSH terms

  • Absorption
  • Algorithms
  • Calibration
  • Calorimetry / methods
  • Hot Temperature
  • Lasers*
  • Materials Testing
  • Optics and Photonics*
  • Silicon Dioxide / chemistry
  • Temperature

Substances

  • Silicon Dioxide