Soft-x-ray projection lithography experiments using Schwarzschild imaging optics

Appl Opt. 1993 Dec 1;32(34):7068-71. doi: 10.1364/AO.32.007068.

Abstract

Soft-x-ray projection imaging is demonstrated by the use of 14-nm radiation from a laser plasma source and a single-surface multilayer-coated ellipsoidal condenser. Aberrations in the condenser and the Schwarzschild imaging objective are characterized and correlated with imaging performance. A new Schwarzschild housing, designed for improved alignment stability, is described.