X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Opt Express. 2010 Jul 19;18(15):15998-6004. doi: 10.1364/OE.18.015998.

Abstract

We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.

Publication types

  • Research Support, Non-U.S. Gov't