Multicomponent wavefield characterization with a novel scanning laser interferometer

Rev Sci Instrum. 2010 Jul;81(7):073101. doi: 10.1063/1.3455213.

Abstract

The in-plane component of the wavefield provides valuable information about media properties from seismology to nondestructive testing. A new compact scanning laser ultrasonic interferometer collects light scattered away from the angle of incidence to provide the absolute ultrasonic displacement for both the out-of-plane and an in-plane components. This new system is tested by measuring the radial and vertical polarization of a Rayleigh wave in an aluminum half-space. The estimated amplitude ratio of the horizontal and vertical displacement agrees well with the theoretical value. The phase difference exhibits a small bias between the two components due to a slightly different frequency response between the two processing channels of the prototype electronic circuitry.

Publication types

  • Research Support, Non-U.S. Gov't
  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Calibration
  • Electric Conductivity
  • Interferometry / instrumentation*
  • Interferometry / methods*
  • Lasers*
  • Transducers
  • Ultrasonics