Precession electron diffraction is used to distinguish between the hexagonal beta high-temperature and the trigonal alpha low-temperature phases of SiO2 quartz. The structures just differ by a kink of the SiO4 tetrahedra arranged along spiraling chains, which induces a loss of the two-fold axis and subsequent twinning in the low-temperature phase. Conventional selected-area electron diffraction (SAED) does not enable the phases distinction since only the intensity of reflections is different. It becomes possible with precession that reduces the dynamical interactions between reflections and makes their intensity very sensitive to small variations of the electron structure factors. Distinction between the twinned individuals in the low-temperature phase is then easily made and the twin law is characterized using stereographic projections. The actual symmetry of precessed zone axis patterns is also examined in detail. Using dynamical intensity simulations, it is shown that under certain thickness conditions, the diffraction class symmetry can be observed on selected area patterns that are to be used in the case of beam sensitive materials such as quartz.
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