Convergence in optical and digital pattern recognition: introduction to the feature issue

Abdul Awwal; Khan Iftekharuddin; Mohammad Karim; Mark Neifeld; David Stork

doi:10.1364/AO.49.00DPR1

Convergence in optical and digital pattern recognition: introduction to the feature issue

Appl Opt. 2010 Apr 1;49(10):DPR1-2. doi: 10.1364/AO.49.00DPR1.

Authors

Abdul Awwal¹, Khan Iftekharuddin, Mohammad Karim, Mark Neifeld, David Stork

Affiliation

¹ National Ignition Facility, Lawrence Livermore National Laboratory, Livermore, California 94551, USA. awwal1@llnl.gov

PMID: 20357847
DOI: 10.1364/AO.49.00DPR1

Abstract

This Applied Optics feature issue, in addition to optical and digital pattern recognition, includes their convergence in the form of computational imaging.

Publication types

Introductory Journal Article