Bias-stress-stable solution-processed oxide thin film transistors
ACS Appl Mater Interfaces
.
2010 Mar;2(3):611-5.
doi: 10.1021/am900787k.
Authors
Youngmin Jeong
,
Changdeuck Bae
,
Dongjo Kim
,
Keunkyu Song
,
Kyoohee Woo
,
Hyunjung Shin
,
Guozhong Cao
,
Jooho Moon
PMID:
20356256
DOI:
10.1021/am900787k
No abstract available
Publication types
Letter
Research Support, Non-U.S. Gov't