Fine-structure characteristics in the emittance images of a strongly focusing He+ beam

Rev Sci Instrum. 2010 Feb;81(2):02B115. doi: 10.1063/1.3277211.

Abstract

The phase space distribution of a strongly focused He(+) ion beam source equipped with concave multiaperture electrodes was measured using a pepper-pot plate and a Kapton foil. The substructure of 301 merging He beamlets was clearly observed on a footprint of pepper-pot hole at the beam waist, where the beam density was 500 mA/cm(2). The position and the width of each beamlet substructure show the effect of interference of beamlets with surrounding one.