Investigation of electrooptic modulator disruption by microwave-induced transients

Opt Express. 2009 Dec 7;17(25):22586-602. doi: 10.1364/OE.17.022586.

Abstract

This paper presents a detailed investigation of the physical mechanisms underlying the disruption of a lithium niobate electrooptic modulator by RF pulses. It is shown that short-term modulator disruption is a direct consequence of resistive heating within the metal conductor of the coplanar waveguide electrode, which leads to a thermo-optic optical phase shift in the waveguides of the modulator. Resistive heating is also shown to contribute to permanent modulator damage at higher RF power. These results indicate that short-term RF disruption, and possibly RF damage, can be mitigated through improved thermal management. They also predict that short-term photonic link disruption can be reduced, if not eliminated, by use of a phase modulated photonic link.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Computer-Aided Design
  • Equipment Design
  • Equipment Failure Analysis
  • Microwaves
  • Niobium / chemistry*
  • Niobium / radiation effects*
  • Optical Devices*
  • Oxides / chemistry*
  • Oxides / radiation effects*
  • Refractometry / instrumentation*
  • Telecommunications / instrumentation*

Substances

  • Oxides
  • Niobium
  • lithium niobate