Using cross-sectional scanning tunneling microscopy on in situ fractured SrTiO(3), one of the most commonly used substrates for the growth of complex oxide thin films and superlattices, atomically smooth terraces have been observed on (001) surfaces. Furthermore, it was discovered that fracturing this material at room temperature results in the formation of stripe patterned domains having characteristic widths ( approximately 10 to approximately 20 nm) of alternating surface terminations that extend over a long range. Spatial characterization utilizing spectroscopy techniques revealed a strong contrast in the electronic structure of the two domains. Combining these results with topographic data, we are able to assign both TiO(2) and SrO terminations to their respective domains. The results of this experiment reveal that fracturing this material leads to reproducibly flat surfaces that can be characterized at the atomic-scale and suggest that this technique can be utilized for the study of technologically relevant complex oxide interfaces.