Probing layer number and stacking order of few-layer graphene by Raman spectroscopy
Small
.
2010 Jan;6(2):195-200.
doi: 10.1002/smll.200901173.
Authors
Yufeng Hao
1
,
Yingying Wang
,
Lei Wang
,
Zhenhua Ni
,
Ziqian Wang
,
Rui Wang
,
Chee Keong Koo
,
Zexiang Shen
,
John T L Thong
Affiliation
1
Center for Integrated Circuit Failure Analysis and Reliability (CICFAR), Department of Electrical and Computer Engineering, National University of Singapore, Singapore.
PMID:
19908274
DOI:
10.1002/smll.200901173
No abstract available
Publication types
Research Support, Non-U.S. Gov't
MeSH terms
Electrons
Graphite / chemistry*
Spectrum Analysis, Raman / methods*
Substances
Graphite