Large scan area high-speed atomic force microscopy using a resonant scanner

Rev Sci Instrum. 2009 Sep;80(9):093707. doi: 10.1063/1.3227238.

Abstract

A large scan area high-speed scan stage for atomic force microscopy using the resonant oscillation of a quartz bar has been constructed. The sample scanner can be used for high-speed imaging in both air and liquid environments. The well-defined time-position response of the scan stage due to the use of resonance allows highly linearized images to be obtained with a scan size up to 37.5 mum in 0.7 s. The scanner is demonstrated for imaging highly topographic silicon test samples and a semicrystalline polymer undergoing crystallization in air, while images of a polymer and a living bacteria, S. aureus, are obtained in liquid.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Equipment Design
  • Equipment Failure Analysis
  • Image Enhancement / instrumentation*
  • Microscopy, Atomic Force / instrumentation*
  • Reproducibility of Results
  • Sensitivity and Specificity
  • Transducers*
  • Vibration