A fast, direct x-ray detection charge-coupled device

P Denes; D Doering; H A Padmore; J-P Walder; J Weizeorick

doi:10.1063/1.3187222

A fast, direct x-ray detection charge-coupled device

Rev Sci Instrum. 2009 Aug;80(8):083302. doi: 10.1063/1.3187222.

Authors

P Denes¹, D Doering, H A Padmore, J-P Walder, J Weizeorick

Affiliation

¹ Engineering Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720, USA.

PMID: 19725646
DOI: 10.1063/1.3187222

Abstract

A charge-coupled device (CCD) capable of 200 Mpixels/s readout has been designed and fabricated on thick, high-resistivity silicon. The CCDs, up to 600 microm thick, are fully depleted, ensuring good infrared to x-ray detection efficiency, together with a small point spread function. High readout speed, with good analog performance, is obtained by the use of a large number of parallel output ports. A set of companion 16-channel custom readout integrated circuits, capable of 15 bits of dynamic range, is used to read out the CCD. A gate array-controlled back end data acquisition system frames and transfers images, as well as provides the CCD clocks.