Evaluation of a novel 4D in vivo dosimetry system

Med Phys. 2009 May;36(5):1672-9. doi: 10.1118/1.3100264.

Abstract

A prototype of a new 4D in vivo dosimetry system capable of simultaneous real-time position monitoring and dose measurement has been developed. The radiation positioning system (RADPOS) is controlled by a computer and combines two technologies: MOSFET radiation detector coupled with an electromagnetic positioning device. Special software has been developed that allows sampling position and dose either manually or automatically in user-defined time intervals. Preliminary tests of the new device include a dosimetric evaluation of the detector in 60Co, 6 MV, and 18 MV beams and measurements of spatial position stability and accuracy. In addition, the effect of metals and other materials on the performance of the positioning system has been investigated. Results show that the RADPOS system can measure in-air dose profiles that agree, on average, within 3%-5% of diode measurements for the energies tested. The response of the detector is isotropic within 1.6% (1 SD) with a maximum deviation of +/- 4.0% over 360 degrees. The maximum variation in the calibration coefficient over field sizes from 6 x 6 to 25 x 25 cm2 was 2.3% for RADPOS probe with the high sensitivity MOSFET and 4.6% for the probe with the standard sensitivity MOSFET. Of the materials tested, only aluminum, lead, and brass caused shifts in the RADPOS read position. The magnitude of the shift varied between materials and size of the material sample. Nonmagnetic stainless steel (Grade 304) caused a distortion of less than 2 mm when placed within 10 mm of the detector; therefore, it can provide a reasonable alternative to other metals if required. The results of the preliminary tests indicate that the device can be used for in vivo dosimetry in 60Co and high-energy beams from linear accelerators.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Computer-Aided Design
  • Equipment Design
  • Equipment Failure Analysis
  • Imaging, Three-Dimensional / instrumentation*
  • Magnetics / instrumentation*
  • Radiometry / instrumentation*
  • Reproducibility of Results
  • Semiconductors
  • Sensitivity and Specificity