The importance of aspect ratio in profile analysis tensiometry

J Colloid Interface Sci. 2009 Feb 15;330(2):501-4. doi: 10.1016/j.jcis.2008.11.034. Epub 2008 Nov 20.

Abstract

The latest developments in profile analysis tensiometry (PAT) for determining surface tension and interfacial viscoelastic parameters involve the determination of a digital interface profile and its best fit with the Young-Laplace equation. In this short communication, we show that the results for surface tension and other interfacial parameters determined by PAT are extremely sensitive to the (aspect) ratio of length to width of a pixel. Fine calibration (to five decimal digits) for the aspect ratio required to obtain physically consistent results is not always achieved with conventional numerical procedures due to nanometer resolution limit of optical imaging devices but can be manually adjusted using the known surface tension of pure water and/or surfactant solutions at reference temperature.