Energy calibration of a high-resolution inelastic x-ray scattering spectrometer

Rev Sci Instrum. 2008 Aug;79(8):083902. doi: 10.1063/1.2968118.

Abstract

The energy scale of a triple-axis x-ray spectrometer with meV energy resolution based on perfect silicon crystal optics is calibrated, utilizing the most recent determination of the silicon lattice parameter and its thermal expansion coefficient and recording the dispersion of longitudinal acoustic and optical phonons in a diamond single crystal and the molecular vibration mode in liquid nitrogen. Comparison of the x-ray results with previous inelastic neutron and Raman scattering results as well as with ab initio phonon dispersion calculations yields an overall agreement better than 2%.

MeSH terms

  • Calibration
  • Crystallization
  • Diamond / chemistry
  • Equipment Design
  • Interferometry
  • Nitrogen / chemistry
  • Optics and Photonics
  • Physical Phenomena
  • Scattering, Radiation
  • Silicon / chemistry
  • Spectrophotometry / instrumentation*
  • Temperature
  • Vibration
  • X-Rays

Substances

  • Diamond
  • Nitrogen
  • Silicon