Technique for the metrology calibration of a Fourier transform spectrometer

Appl Opt. 2008 Nov 10;47(32):6009-13. doi: 10.1364/ao.47.006009.

Abstract

A method is presented for using a Fourier transform spectrometer (FTS) to calibrate the metrology of a second FTS. This technique is particularly useful when the second FTS is inside a cryostat or otherwise inaccessible.