Some modifications of electric circuitry for internal friction measurements of U-shape specimens

O Yoshinari; M Koiwa; H Sugawara; I Satoh

doi:10.1063/1.1136194

Some modifications of electric circuitry for internal friction measurements of U-shape specimens

Rev Sci Instrum. 1980 Mar;51(3):394. doi: 10.1063/1.1136194.

Authors

O Yoshinari¹, M Koiwa, H Sugawara, I Satoh

Affiliation

¹ Graduate School, Tohoku University, Sendai 980, Japan.

PMID: 18647083
DOI: 10.1063/1.1136194

Abstract

Some modifications of the electric circuitry are described for the apparatus of the internal friction measurement of thin wire specimens; the apparatus has been developed by Franklin et al. The improved apparatus has been successfully used in the internal friction measurements of cold-worked vanadium specimens.