Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy

Phys Rev Lett. 2008 Jun 13;100(23):236106. doi: 10.1103/PhysRevLett.100.236106. Epub 2008 Jun 13.

Abstract

Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance characteristics. Furthermore, saddle points which connect local minima can suddenly switch to connect different minima. Configurations driven into metastability by the tip motion can thus suddenly access lower energy structures when thermal activation becomes allowed within the time required to detect the resulting average dissipation.