Applied physics. Focus on x-ray diffraction
Science
.
2008 Jul 18;321(5887):352-3.
doi: 10.1126/science.1161183.
Author
Henry N Chapman
1
Affiliation
1
Centre for Free-Electron Laser Science, University of Hamburg and Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany. henry.chapman@desy.de
PMID:
18635785
DOI:
10.1126/science.1161183
No abstract available
Publication types
Comment
MeSH terms
Microscopy / instrumentation
Microscopy / methods*
X-Ray Diffraction*