X-ray topography of piezoelectric La(3)Ta(14)Ga(5.5)O(14) crystal grown by Czochralski Method

Y Yoneda; J Mizuki; H Takeda; T Shiosaki

doi:10.1109/TUFFC.2008.741

X-ray topography of piezoelectric La(3)Ta(14)Ga(5.5)O(14) crystal grown by Czochralski Method

IEEE Trans Ultrason Ferroelectr Freq Control. 2008 May;55(5):971-4. doi: 10.1109/TUFFC.2008.741.

Authors

Y Yoneda¹, J Mizuki, H Takeda, T Shiosaki

Affiliation

¹ Japan Atomic Energy Agency (JAEA), Synchrotron Radiation Research Unit, Sayo-gun, Hyogo 679-5148, Japan. yoneda@spring8.or.jp

PMID: 18519197
DOI: 10.1109/TUFFC.2008.741

Abstract

We performed synchrotron X-ray topography on a La(3)Ta0(0.5)Ga (5.5)O(14) (LTG) crystal grown by the Czochralski method. Since a synchrotron X-ray source can provide high-energy X-rays, one can detect bulk structures by X-ray topography. LTG is one of the most attractive piezoelectric crystals along with La(3)Ga(5)SiO(14) (LGS) because of its excellent acoustic properties (temperature compensation of acoustic losses). Since LTG single crystals can be grown from a stoichiometric melt, it was expected that single crystals with better quality than the LGS crystal, which cannot be grown from a stoichiometric system but only from a congruent melt, can be obtained. However, 60 keV X-ray topography revealed that the LTG crystal quality was not as high as the LGS crystal quality. The crystal quality of the central region was lower than that of the surrounding region.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Ceramics / chemistry*
Crystallization / methods*
Electromagnetic Phenomena / methods*
Materials Testing
Surface Properties
X-Ray Diffraction*