Total internal reflection microscopy (TIRM) is a method for the precise measurement of interaction potentials between a spherical colloidal particle and a wall. The method is based on single-particle evanescent wave light scattering. The well-established model used to interpret TIRM data is based on an exponential relation between scattering intensity and particle wall distance. However, applying this model for a certain range of experimental parameters leads to significant distortions of the measured potentials. Using a TIRM setup based on a two-wavelength illumination technique, we were able to directly measure the intensity distance relation revealing deviations from an exponential decay. The intensity-distance relations could be compared to scattering simulations taking into account exact experimental parameters and multiple reflections between a particle and the wall. Converging simulation results were independently obtained by the T-matrix method and the discrete sources method (DSM) and show excellent agreement with experiments. Using the new scattering model for data evaluation, we could reconstruct the correct potential shape for distorted interaction potentials as we demonstrate. The comparison of simulations to experiment intrinsically yields a new method to determine absolute particle-wall distances, a highly desired quantity in TIRM experiments.