Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

K Y Kim; B Yellampalle; A J Taylor; G Rodriguez; J H Glownia

doi:10.1364/ol.32.001968

Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

Opt Lett. 2007 Jul 15;32(14):1968-70. doi: 10.1364/ol.32.001968.

Authors

K Y Kim¹, B Yellampalle, A J Taylor, G Rodriguez, J H Glownia

Affiliation

¹ Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA. kykim@lanl.gov

PMID: 17632612
DOI: 10.1364/ol.32.001968

Abstract

A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of >10 ps with ~25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization.