We present a statistical approach that combines comprehensive current-voltage data acquisition during the controlled manipulation of a molecular junction with subsequent statistical analysis. Thereby the most probable transport characteristics can be determined. The excellent sensitivity of this impartial approach to even subnanometer-long molecules is illustrated by benzene-1,4-dithiol and 4,4"-bis(acetylthiol)-2,2',5',2"-tetramethyl-[1,1';4',1"] terphenyl results.