Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals

Clive A Prestidge; Timothy J Barnes; William Skinner

doi:10.1211/jpp.59.2.0011

Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals

J Pharm Pharmacol. 2007 Feb;59(2):251-9. doi: 10.1211/jpp.59.2.0011.

Authors

Clive A Prestidge¹, Timothy J Barnes, William Skinner

Affiliation

¹ Ian Wark Research Institute, The Australian Research Council Special Research Centre for Particle and Material Interfaces, University of South Australia, Mawson Lakes, SA 5095, Australia. clive.prestidge@unisa.edu.au

PMID: 17270078
DOI: 10.1211/jpp.59.2.0011

Abstract

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is a highly surface sensitive analytical method for surface chemical identification and surface chemical distribution analysis (mapping). Here we have explored the application of ToF-SIMS for the characterization of solid-state pharmaceuticals and highlight specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices (pellets and polymeric carriers) and the face-specific properties of pharmaceutical crystals.

Publication types

Evaluation Study
Research Support, Non-U.S. Gov't
Review

MeSH terms

Drug Delivery Systems
Pharmaceutical Preparations / chemistry*
Spectrometry, Mass, Secondary Ion / instrumentation
Spectrometry, Mass, Secondary Ion / methods*
Surface Properties
Technology, Pharmaceutical / instrumentation
Technology, Pharmaceutical / methods

Substances

Pharmaceutical Preparations