Single-particle evanescent light scattering simulations for total internal reflection microscopy

Appl Opt. 2006 Oct 1;45(28):7299-308. doi: 10.1364/ao.45.007299.

Abstract

We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass-solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.

MeSH terms

  • Algorithms*
  • Colloids / chemistry*
  • Computer Simulation
  • Image Enhancement / methods*
  • Image Interpretation, Computer-Assisted / methods*
  • Light
  • Microscopy / methods*
  • Models, Chemical
  • Particle Size
  • Refractometry / methods*
  • Reproducibility of Results
  • Scattering, Radiation
  • Sensitivity and Specificity

Substances

  • Colloids