High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements

Victor V Zelenogorsky; Alexander A Solovyov; Ilya E Kozhevatov; Eugene E Kamenetsky; Eugene A Rudenchik; Oleg V Palashov; Dmitry E Silin; Efim A Khazanov

doi:10.1364/ao.45.004092

High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements

Appl Opt. 2006 Jun 10;45(17):4092-101. doi: 10.1364/ao.45.004092.

Authors

Victor V Zelenogorsky¹, Alexander A Solovyov, Ilya E Kozhevatov, Eugene E Kamenetsky, Eugene A Rudenchik, Oleg V Palashov, Dmitry E Silin, Efim A Khazanov

Affiliation

¹ Institute of Applied Physics of the Russian Academy of Science, Novgorod, Russia. vvmailv@mail.ru

PMID: 16761050
DOI: 10.1364/ao.45.004092

Abstract

An optical system that comprises two devices for remote measurements, a broadband optical interferometer and a scanning Hartmann sensor, is described. The results of simultaneous measurements with both devices and the results of numerical modeling of sample surface heating are presented.