X-ray diffraction method for the investigation of contacts between solid surfaces

J Synchrotron Radiat. 2005 Jul;12(Pt 4):484-7. doi: 10.1107/S090904950501215X. Epub 2005 Jun 15.

Abstract

A coherent X-ray scattering method for investigating the formation of the contact region between two solid surfaces is presented. Diffraction of X-rays from two crossed cylindrical quartz surfaces, coated with Cr and TiO(2), revealed a total contact area of 90 +/- 10 microm. In the so-called Hertz model for two surfaces in non-adhesive contact, this value is directly related to the displacement of the surfaces and the applied external force. Values of 40 +/- 3 nm for the displacement and 24 +/- 3 mN for the force are found. The method is also useful for studying liquids in confinement.

Publication types

  • Evaluation Study

MeSH terms

  • Algorithms*
  • Chromium / analysis
  • Chromium / chemistry*
  • Computer Simulation
  • Materials Testing / methods*
  • Models, Chemical
  • Quartz / analysis
  • Quartz / chemistry*
  • Spectrometry, X-Ray Emission / methods*
  • Surface Properties
  • Titanium / analysis
  • Titanium / chemistry*
  • X-Ray Diffraction / methods*

Substances

  • Chromium
  • Quartz
  • titanium dioxide
  • Titanium