JIS Z 4910 (anti-scatter grids) of the JIS standards was revised in 2000. Major points of revision were the provision of general-purpose and mammographic anti-scatter grids and changes in the diameter of the measuring field and difference in the manufacturing allowance. We measured the physical characteristics (grid selectivity, contrast improvement ratio, and grid exposure factor) of [general-purpose anti-scatter grids] referring to the methods of measurement [JIS Z 4910:2000] and [JIS Z 4910:1983] using an inverter-type high-voltage generator. Physical characteristics indicated a lower value for [JIS Z 4910:2000] than for [JIS Z 4910:1983]. [JIS Z 4910:2000] was able to measure primary radiation and scattered radiation more accurately than [JIS Z 4910:1983] because of the diameter of the measuring field and the measurement arrangement. Moreover, the physical characteristic values were influenced by radiation quality, e.g., differences in high-voltage generators. In the method of measuring stipulated by JIS, strict conditions regarding the arrangement of the measurement tools and the stability and other factors of the power output of the X-ray generator are provided for the type approval test conducted by the manufacturer.