Electron transport through YBa2Cu3O7-delta grain boundary interfaces between 4.2 and 300 K

C W Schneider; S Hembacher; G Hammerl; R Held; A Schmehl; A Weber; T Kopp; J Mannhart

doi:10.1103/PhysRevLett.92.257003

Electron transport through YBa2Cu3O7-delta grain boundary interfaces between 4.2 and 300 K

Phys Rev Lett. 2004 Jun 25;92(25 Pt 1):257003. doi: 10.1103/PhysRevLett.92.257003. Epub 2004 Jun 24.

Authors

C W Schneider¹, S Hembacher, G Hammerl, R Held, A Schmehl, A Weber, T Kopp, J Mannhart

Affiliation

¹ Experimentalphysik VI, Center for Electronic Correlations and Magnetism, Institute of Physics, Augsburg University, D-86135 Augsburg, Germany.

PMID: 15245051
DOI: 10.1103/PhysRevLett.92.257003

Abstract

The current-induced dissipation in YBa(2)Cu(3)O(7-delta) grain boundary tunnel junctions has been measured between 4.2 and 300 K. It is found that the resistance of 45 degrees (100)/(110) junctions decreases linearly by a factor of 4 when their temperature is increased from 100 to 300 K. At the superconducting transition temperature T(c) the grain boundary resistance of the normal state and of the superconducting state extrapolates to the same value.