Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces

Metin A Demir; Joel T Johnson

doi:10.1364/josaa.20.002330

Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces

J Opt Soc Am A Opt Image Sci Vis. 2003 Dec;20(12):2330-7. doi: 10.1364/josaa.20.002330.

Authors

Metin A Demir¹, Joel T Johnson

Affiliation

¹ Department of Electrical Engineering and ElectroScience Laboratory, The Ohio State University, 205 Dreese Laboratories, 2015 Neil Avenue, Columbus, Ohio 43210, USA.

PMID: 14686512
DOI: 10.1364/josaa.20.002330

Abstract

A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections.