Frequency-dependent reflectivity of shock-compressed xenon plasmas

Phys Rev E Stat Nonlin Soft Matter Phys. 2003 Sep;68(3 Pt 2):036403. doi: 10.1103/PhysRevE.68.036403. Epub 2003 Sep 26.

Abstract

Results for the reflection coefficient of shock-compressed dense xenon plasmas at pressures of 1.6-20 GPa and temperatures around 30 000 K using laser beams of wavelengths 1.06 micro m and 0.694 micro m are presented, which indicate metallic behavior at high densities. For the theoretical description of the experiments, a quantum statistical approach to the dielectric function is used. The comparison with molecular dynamics simulations is discussed. We conclude that reflectivity measurements at different wavelengths can provide information about the density profile of the shock wave front.