Towards a quantitative phase-field model of two-phase solidification

Phys Rev E Stat Nonlin Soft Matter Phys. 2003 Jul;68(1 Pt 1):010602. doi: 10.1103/PhysRevE.68.010602. Epub 2003 Jul 30.

Abstract

We construct a diffuse-interface model of two-phase solidification that quantitatively reproduces the classic free boundary problem on solid-liquid interfaces in the thin-interface limit. Convergence tests and comparisons with boundary integral simulations of eutectic growth show good accuracy for steady-state lamellae, but the results for limit cycles depend on the interface thickness through the trijunction behavior. This raises the fundamental issue of diffuse multiple-junction dynamics.