Atomic structure of InSb(001) and GaAs(001) surfaces imaged with noncontact atomic force microscopy

J J Kolodziej; B Such; M Szymonski; F Krok

doi:10.1103/PhysRevLett.90.226101

Atomic structure of InSb(001) and GaAs(001) surfaces imaged with noncontact atomic force microscopy

Phys Rev Lett. 2003 Jun 6;90(22):226101. doi: 10.1103/PhysRevLett.90.226101. Epub 2003 Jun 3.

Authors

J J Kolodziej¹, B Such, M Szymonski, F Krok

Affiliation

¹ Institute of Physics, Jagiellonian University, Reymonta 4, 30-059 Kraków, Poland.

PMID: 12857322
DOI: 10.1103/PhysRevLett.90.226101

Abstract

Noncontact atomic force microscopy (NC-AFM) has been used to study the c(8x2) InSb(001) and the c(8x2) GaAs(001) surfaces prepared by sputter cleaning and annealing. Atomically resolved tip-surface interaction maps display different characteristic patterns depending on the tip front atom type. It is shown that representative AFM maps can be interpreted consistently with the most recent structural model of A(III)B(V)(001) surface, as corresponding to the A(III) sublattice, to the B(V) sublattice, or to the combination of both sublattices.